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EMG-XFER (Emergency Transfer)
Issue 1 June 2005 1139
Notes:
a. See POWER
on page 1869 for a description of this test.
b. See AC-POWER
on page 333 for a description of this test.
c. See CARR-POW (Carrier Power Supply)
on page 770 for a description of this test.
d. See CABINET (Cabinet Sensors)
on page 758 for a description of this test.
e. See EXT-DEV ADMIN? Y (External Device Alarm)
on page 1246 section for a description of
this test.
f. See RING-GEN (Analog Ring Generator)
on page 1942 section for a description of this test.
These tests show up in the test sequence only if there is a TN768 or TN780 Tone-Clock
circuit pack in the EPN being tested.
External Alarm Lead Query test (#120) (e
)XXND
Analog Ring Generator Initialization test
Analog Ring Generator Initialization test (#117) (f
)X XND
Analog Ring Generator Query test (#118) (f
)XXND
1. D = Destructive, ND = Nondestructive
Table 391: System Technician-Demanded Tests: EMG-XFER (Multicarrier Cabinets)
Order of Investigation Short Test
Sequence
Long Test
Sequence
D/ND
1
2 of 2