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DS1-BD (DS1 Interface Circuit Pack)
Issue 1 June 2005 1047
End Loopback/Span Test (#1216)
This test is destructive.
The End Loopback/Span test deactivates an active loop-back or span test on a TN767E DS1
circuit pack. Bit error counting against the received test pattern stream halts, and sending of the
framed 3-in-24 test pattern ceases. If either the CPE loop-back jack or the far-end CSU is
looped, the loop-back deactivate code is sent. If the loop back could not be deactivated, the test
will FAIL and a MINOR alarm is noted in the alarm log until the loop back is cleared.
The test is highly destructive and can only be initiated by a technician-demanded test
ds1-loop location end-loopback/span-test. Since only one of these three different
long-duration loop-back/span tests can be active at a time, the TN767E circuit pack knows
which loop-back/span test to halt.
Use busyout board to busy out all trunks or ports on the DS1 Interface circuit pack before
running this End Loopback/Span test.
PASS A single bit error has been successfully injected into an active framed
3-in-24 test pattern.
0
NO
BOARD
The test could not relate the internal ID to the port (no board).
This could be due to incorrect translations, no board is inserted, an
incorrect board is inserted, or an insane board is inserted.
1. Verify that the board’s translations are correct. Use add ds1
location to administer the DS1 interface if it is not already
administered.
2. If board was already administered correctly, check the error log to
determine whether the board is hyperactive. If so, the board was shut
down. Reseating the board will re-initialize it.
3. If the board was found to be correctly inserted in step 1, enter
busyout board
4. Enter reset board
5. Enter release board
6. Enter test board long
This should re-establish the link between the internal ID and the port.
Table 359: Test #1215 Inject Single Bit Error Test (continued)
Error
Code
Test
Result
Description / Recommendation
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