Filter
Top Products
DS1-BD (DS1 Interface Circuit Pack)
Issue 1 June 2005 1045
Inject Single Bit Error Test (#1215)
This test is destructive.
The Inject Single Bit Error test causes a single bit error to be sent within an active framed
3-in-24 test pattern.
The test is highly destructive and can only be initiated by a technician-demanded test
ds1-loop location inject-single-bit-error. An attempt to use this command is
rejected if none of the three long-duration DS1 loop-back/span tests (CPE Loopback Jack test,
Far CSU Loopback test, One-Way Span test) are active on a TN767E circuit pack.
Use busyout board to busy out all trunks or ports on the DS1 Interface circuit pack before
running the Inject Single Bit Error test.
Use list measurements ds1 summary to show the number of bit errors detected
(Loopback/Span Test Bit-Error Count field). Injecting this single bit error should
increment the bit error count of the loop-back/span test by one.
0
NO
BOARD
The test could not relate the internal ID to the port (no board).
This could be due to incorrect translations, no board is inserted, an
incorrect board is inserted, or an insane board is inserted.
1. Verify that the board’s translations are correct. Use add ds1
location to administer the DS1 interface if it is not already
administered.
2. If board was already administered correctly, check the error log to
determine whether the board is hyperactive. If so, the board was shut
down. Reseating the board will re-initialize it.
3. If the board was found to be correctly inserted in step 1, enter busyout
board
4. Enter reset board
5. Enter release board
6. Enter test board long
This should re-establish the link between the internal ID and the port.
Table 358: Test #1214 One-Way Span Test (continued)
Error
Code
Test
Result
Description / Recommendation
4 of 4