Avaya 03-300430 Home Security System User Manual


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Communication Manager Maintenance-Object Repair Procedures
1042 Maintenance Procedures for Avaya Communication Manager 3.0, Media Gateways and Servers
One-Way Span Test (#1214)
This test is destructive.
The One-Way Span test allows 1-way span testing to and from remote test equipment or
another Communication Manager solution. This tests all circuitry and facilities from the local
TN767E DS1 board to the remote test equipment or other Communication Manager solution.
The test is destructive and can only be initiated by a technician-demanded test ds1-loop
location one-way-span-test-begin.
Use busyout board to busy out all trunks or ports on the DS1 Interface circuit pack before
running the One-Way Span test.
The One-Way Span test has the TN767E DS1 Interface circuit pack transmit a framed 3-in-24
test pattern and attempts to receive and verify the pattern. If the TN767E board receives a
framed 3-in-24 test pattern sent from another Communication Manager system or test
equipment at the far end of the DS1, it begins counting bit errors within the received pattern.
Note:
Note: G700: When a TN464 and an MM710 are connected, the One-Way Span test
does not frame-align to the 3-in-24 repetitive pattern, and the test fails.
The status of the One-Way Span test appears in the hardware error log via Error Type #3902.
Several aux values give information on the status of the test.
Use list measurements ds1 summary to see the length of time the test has been running
(Test Duration field) and number of bit errors detected (Loopback/Span Test
Bit-Error Count field). If the test pattern is sent cleanly over the span from the far end, the
number of bit errors should be very low. The Test Duration field is 0 until the test pattern is
received from the far end. Upon receiving the test pattern, the board begins calculating the test
duration and number of bit errors. The command also shows the type of loop-back/span test
executing (Test field), the type of pattern generated for the loop-back/span test (Pattern
field), and whether the pattern (i.e., 3-in-24 Pattern) is synchronized (Synchronized field).
Use test ds1-loop location end-loopback/span-test or release board to end
the test. Use release board to restore all trunks or ports on the TN767E DS1 Interface circuit
pack to the in-service state.
Table 358: Test #1214 One-Way Span Test
Error
Code
Test
Result
Description / Recommendation
ABRT Internal system error
1. Retry test ds1-loop location one-way-span-test-begin at
1-minute intervals up to 5 times.
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