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DS1-FAC (DS1 Facility)
Issue 1 June 2005 1069
System Technician-Demanded Tests:
Descriptions And Error Codes
Investigate tests in the order presented. By clearing error codes associated with the Failure
Audit, you may clear errors generated from other tests in the sequence. Use test board to
run Failure Audit.
.
Far-End Internal Loop-Back Test (#797)
This test is destructive.
This test starts at the DS1 converter circuit pack whose equipment location was entered and
traverses over the specified facility and loops at the internal facility interface on the other DS1
converter circuit pack in the DS1 converter complex. See the following diagram.
Every part of this test is executed under firmware control and the result is sent back to the
maintenance software. The test is executed by sending digital data through every DS1 channel
on this facility. For TN574 DS1 Converter facilities, test patterns are sent through every DS1
channel. For TN1654 DS1 Converter facilities, test patterns are sent through one DS1 channel.
If there is only one DS1 facility available, the system will not allow that last facility to be busied
out. In that case, the DS1 converter circuit pack must be busied out before executing this test.
For a standard-, duplex-, or high-reliability system (no PNC duplication), if there is only one DS1
facility available, then this test can only be executed at the endpoint that is closer to the media
server relative to the neighbor DS1 converter circuit pack because of its impacts on the system
control links. For TN574 DS1 converter boards, the completion of the test will be delayed in this
configuration to wait for the recovery of the system control links. For a critical-reliability system
(PNC duplication) or for a system with multiple DS1 facilities, the test can be executed at any
DS1 converter circuit pack.
If the test passes on a TN1654 DS1 facility, the round trip delay time appears in milliseconds in
the Error Code field. The round trip delay time is the length of time in milliseconds it takes for
the firmware to receive the test pattern after it has been sent.
Order of Investigation Short Test
Sequence
Long Test
Sequence
External
Loopback
Reset
Sequence
D/ND
1
1. D = Destructive; ND = Nondestructive
Failure Audit (#949) ND
DS1 Interface Options Audit
(#798)
XX ND
Far-End Internal Loopback
(#797)
XD
Near-End External
Loopback test (#799)
XD