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4 System Manual Issue 4
7.5.3 Swept Gate Experiment [Variable Width, Variable Delay]
The procedure for conducting a Swept Gate experiment with variable width and variable
delay is the same as that for conducting a Swept Gate experiment with fixed width and
variable delay with the following parameter configuration changes:
• Gate Delay Start value does not equal Gate Delay End value;
• Gate Width Start value does not equal Gate Width End value.
Refer to Section 7.5.3, Swept Gate Experiment [Variable Width, Variable Delay], for
additional information.
7.5.4 Static Gate Experiment [Fixed Width, Fixed Delay]
The procedure for conducting a Static Gate experiment is similar to that for conducting a
Swept Gate experiment with the following parameter configuration changes:
• Gate Mode: Repetitive;
• Gate Width and Gate Delay must be configured using the Repetitive Gating
Setup
dialog as shown in Figure 7-31.
Figure 7-31: Repetitive Gating Setup Dialog
Refer to Section 7.5.4, Static Gate Experiment [Fixed Width, Fixed Delay], for additional
information.
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