MX4428 MXP Engineering / Technical Manual Document: LT0273
MXP Loop Filter Board
Page 9-16 24 March 2006 Issue 1.5
9.17 NON LATCHING TEST MODE
In this mode no alarms are latched, and all filtering is bypassed, however detector and
device LEDs follow the alarm status. About 10 seconds after a device goes into alarm it is
automatically “held in reset” for about 10 seconds, and then sampling starts again from the
beginning.
9.18 COMMISSION MODE
Filtering is speeded up or bypassed. AVF is bypassed.
9.19 FAST POINT TEST
A point which supports remote test is put into alarm by its remote test facility. A point which
does not support remote test is put into alarm by simulating a high reading. Filtering is
speeded up or bypassed. AVF is bypassed.
9.20 SLOW POINT TEST
A point which supports remote test is put into alarm by its remote test facility. A point which
does not support remote test is put into alarm by simulating a high reading. Filtering and
AVF operate normally.
9.21 SUMMARY OF ALL TEST MODES
Table 9-1 shows the features of the various alarm tests which may be applied to detectors
and input ancillary devices.
Note that there is no remote test facility on a 8xxH heat detector or on the heat component of
a 8xxPH or 8xxCH detector. On MX4428 there is no way to specify an alarm test on the heat
component of an 8xxPH or 8xxCH detector.