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Index
Accessories
alignment of, 22
Aperture, 16
Background DC level, 33
Baseline signal, 33
Binning
along columns, 13
along rows, 13
Bottom Clamps, 28
table of, 29
Calibration
suitable light sources, 21
Cautions
baseline signal shift, 34
IR contamination, 31
scintillator & UV, 33
CCD
perpendicular mode operation, 12
square format, 13
Cleaning, 37
Cleaning optical surfaces, 37
C-mount, 28
adapters, 16
assembly, 28
lens installation/removal, 16
support recommendations, 28
Cold finger, 9
Contact information, 50
Cooler switch, 17
Cooling and vacuum, 18
Cooling block, 17
Dark charge pattern, 33
Detector
Type 1, 14
detector cable, 11
Detectors
focusing and alignment, 21
rotation of, 22
Diagnostic Instruments Bottom Clamp, 28
Diagnostic Instruments Relay Lens, 28
Diode
thermal sensing, 17
Drawings, dimensioned, 41
EMF spike, 31
Enclosures
CCD, 9
electronics, 9
heat-removal block and coolant, 9
Entrance slit, 12
Environmental conditions, 39
F mount
port selection, 30
F number, 16
Fluorescent probe, 27
F-mount
assembly of, 30
lens installation/removal, 15
operation with microscope bottom port,
29
support recommendations, 30
Focusing, 21
imaging systems, 25
microscope, 25
Focusing and Alignment, 21
Gain
setting criteria, 12
Humidity
excessive in vacuum enclosure, 34
Imaging applications, 15
Imaging systems
field of view, 24
focusing, 25
IR
CCD sensitivity to, 31
IR blockers, 31
Lens
aperture, 16
mounting, 16
removal
, 16
Light throughput, 27
Live cell fluorescence microscopy, 27
Maintenance, 37
Microscope
mounting, 28
C-mount, 28
F-mount, 28
Microscopy
arc lamp EMF spike damage warning, 31
focusing, 29
IR blockers, 31
light throughput, 27
parfocality, 29
Xenon or Hg lamp EMF spike, 31
Microscopy applications, 27
Mounting
microscope, 28
C-mount, 28
F-mount, 28
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